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Touch Probes

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All Touch Probes

Monitoring the Process

area scanner, laser tracker, touch probe, laser scanner, optical profiler, Exact Metrology

Automated measurements of workpieces in machines are progressively more important in today’s manufacturing processes, resulting in shorter production times and fewer interruptions. What’s more, there is more confidence when it comes to the measurement process.

Affordably Priced Handheld XRF Analyzer

The Vanta Element from Olympus Scientific Solutions Americas provides the same  fast material- and alloy-grade identification as the line’s other models in a rugged, cost-effective package. The 2.9-lb X-ray fluorescence (XRF) analyzer works in temperatures ranging from 14 degrees F to 113 degrees F (-10 degrees C to 45 degrees C).

High-Performance Height Gauge

Mitutoyo America Corp.’s QM-Height Series measures height, height difference (step), inside/outside widths, inside/outside diameters, circle pitch, and free-form surface max/min heights to ±(2.4+2.1L/600) μm. Simple-to-use control panel enables most measurements to be made with one keystroke.

Two Measurement Solutions from Mitutoyo

The multisensor MiSCAN Vision System is a coordinate measuring machine (CMM) with a microscopic-level scanning probe. The compact MiSTAR 555 is a space-saving in-line or near-line CNC CMM designed for high-speed, high-accuracy measurements with assurance from 10° C to 40° C.

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